Press Releases / News

A publication by Fraunhofer CSP in the journal physica status solidi a entitled Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential-Induced Degradation at the Rear Side made it into the journal's most downloaded papers in 2018-2019.

For the development of a test method for a frequently occurring defect in silicon solar cells, Dr. Volker Naumann from the Fraunhofer Center for Silicon Photovoltaics CSP received the DIN Innovation Award. The 32-year-old physicist was handed over the prize endowed with 3,000 euros at the Hannover Messe yesterday. His work helps to improve the lifetime and the efficiency of solar modules. The test method that he developed provides the basis for a DIN standard.

Dr Volker Naumann of the Fraunhofer Center for Silicon Photovoltaics (CSP) was singled out for the Best Poster Presentation in the subject area of photovoltaic modules at the PVSEC conference in Singapore. Dr Naumann presented the PIDcheck, a mobile device that can determine the susceptibility of solar modules already installed in the field to potential-induced degradation (PID). The defect is one of the most frequent causes of performance losses in photovoltaic modules with crystalline silicon solar cells.

Dr. Volker Naumann was awarded the Material Prize 2016 of Schott AG for elucidating a frequent defect in silicon solar cells. The 31-year old physicist received the prize worth 1500 euros during the Advisory Board session of the Fraunhofer Institute for Microstructure of Materials and Systems IMWS in Halle (Saale). His work helps to improve the life and efficiency of solar modules.

The Fraunhofer Center for Silicon Photovoltaics CSP in Halle recognized for the development of a test device for the quality control of solar cells and solar modules at the award of the IQ Prize. Dr. Volker Naumann, who developed the device along with his colleagues, received a recognition award from Halle’s Mayor Egbert Geier at today’s award ceremony.

The PIDcon test device developed by the Fraunhofer Center for Silicon Photovoltaics CSP is nominated for the Intersolar Award 2015. The device can be used to detect potential-induced degradation (PID), one of the most frequent causes of power losses in photovoltaics modules with crystalline silicon solar cells, at solar cell level and thus far more quickly and easily than before – an enormous advantage for quality control. The innovation prize will be awarded on 10 June at the Intersolar trade fair in Munich.

The Fraunhofer Center for Silicon Photovoltaics CSP and Freiberg Instruments Metrology Solutions have developed a test to measure the PID susceptibility of solar cells and modular components. Operations went hand in hand: The Fraunhofer CSP is responsible for the method which will be applied in the measuring device which was developed by Freiberg Instruments.