Potencial Induced Degradation - Testing - Root Cause Analysis - Characterization
Potencial Induced Degradation - Testing - Root Cause Analysis - Characterization

PID Testing Devices

PIDcon

testing equipment PIDcon
© Fraunhofer CSP
Thanks to the testing equipment PIDcon potential-induced degradation (PID) can be detected already on solar cell level.
  • suitable for PID testing of solar cells or encapsulant materials (polymers, glass)
  • quick PID tests without manufacturing of test modules
  • cells to be inspected after PID-testing without breakage
  • testing temperature freely adjustable
  • safety housing chamber with interlock switches
  • can handle cells and materials up to 8“ edge length

PIDcheck

PIDcheck prototype
© Fraunhofer CSP
PIDcheck prototype at work: The serial production of the mobile test equipment for PV modules in systems is about to start soon.
  • fast PID testing of mounted PV modules in existing PV systems
  • suitable for mobile outdoor measurements
  • predictions on long-term yields of photovoltaic plants
  • proving the regeneration of PID-damaged cells

Publications

  • V. Naumann, D. Lausch, N. Schüler, C. Hagendorf, Outdoor PID testing of modules in PV systems, 26th International Photovoltaic Science and Engineering Conference (PVSEC-26), Singapur, 2016.
  • V. Naumann, N. Schüler, C. Hagendorf, Rapid PID testing and assessment of PID stability at installed PV modules, 11th SNEC International Photovoltaic Power Generation Conference & Exhibition 2018, Shanghai (China), 2018.
  • V. Naumann, N. Schüler, C. Hagendorf, On-site PID testing, PV-TECH Power Vol. 15, June 2018, pp. 88-91, https://www.pv-tech.org/technical-papers/on-site-pid-testing

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